TY  - RPRT
TI  - Excitation frequency dependence of noise and minimum detectable force in amplitude-modulation atomic force microscopy
AU  - Kenichi Umeda
AU  - Noriyuki Kodera
PY  - 2025
DO  - 10.1103/z1cp-wxbx
UR  - https://arxiv.org/abs/2411.17085
ID  - 2411.17085
ER  -