@misc{indiciaeebec4f3a0006,
  title = {Single Event Upsets characterization of 65 nm CMOS 6T and 8T SRAM cells for ground level environment},
  author = {Daniel Malagon and Gabriel Torrens and Jaume Segura and Sebastia A. Bota},
  year = {2024},
  doi = {10.1016/j.microrel.2020.113696},
  url = {https://arxiv.org/abs/2411.17198},
  note = {Source identifier: 2411.17198}
}