TY  - RPRT
TI  - Single Event Upsets characterization of 65 nm CMOS 6T and 8T SRAM cells for ground level environment
AU  - Daniel Malagon
AU  - Gabriel Torrens
AU  - Jaume Segura
AU  - Sebastia A. Bota
PY  - 2024
DO  - 10.1016/j.microrel.2020.113696
UR  - https://arxiv.org/abs/2411.17198
ID  - 2411.17198
ER  -