TY  - RPRT
TI  - Two-Carrier Model-Fitting of Hall Effect in Semiconductors with Dual-Band Occupation: A Case Study in GaN Two-Dimensional Hole Gas
AU  - Joseph E. Dill
AU  - Chuan F. C. Chang
AU  - Debdeep Jena
AU  - Huili Grace Xing
PY  - 2024
DO  - 10.1063/5.0248998
UR  - https://arxiv.org/abs/2412.03818
ID  - 2412.03818
ER  -