TY  - RPRT
TI  - Critical assessment of contact resistance and mobility in tin perovskite semiconductors
AU  - Youcheng Zhang
AU  - Stefano Pecorario
AU  - Xian Wei Chua
AU  - Xinglong Ren
AU  - Cong Zhao
AU  - Rozana Mazlumian
AU  - Satyaprasad P. Senanayak
AU  - Krishanu Dey
AU  - Sam Stranks
AU  - Henning Sirringhaus
PY  - 2024
DO  - 10.1002/aelm.202400924
UR  - https://arxiv.org/abs/2412.06591
ID  - 2412.06591
ER  -