TY  - RPRT
TI  - Temperature-induced hysteretic behavior of resistivity and magnetoresistance of electrodeposited bismuth films for X- ray transition-edge sensor absorbers
AU  - Orlando Quaranta
AU  - Nunzia Coppola
AU  - Lisa Gades
AU  - Alice Galdi
AU  - Tejas Guruswamy
AU  - Alessandro Mauro
AU  - Luigi Maritato
AU  - Antonino Miceli
AU  - Sergio Pagano
AU  - Carlo Barone
PY  - 2024
UR  - https://arxiv.org/abs/2412.07035
ID  - 2412.07035
ER  -