TY  - RPRT
TI  - Stoichiometry and Thickness of Epitaxial SrTiO$_{3}$ on Silicon (001): an Investigation of Physical, Optical and Electrical Properties
AU  - Andries Boelen
AU  - Marina Baryshnikova
AU  - Anja Ulrich
AU  - Kamal Brahim
AU  - Joris Van de Vondel
AU  - Christian Haffner
AU  - Clement Merckling
PY  - 2025
DO  - 10.1021/acs.cgd.5c00103
UR  - https://arxiv.org/abs/2412.07395
ID  - 2412.07395
ER  -