@misc{indiciae096d0db10ca4,
  title = {Testbeam Characterization of a SiGe BiCMOS Monolithic Silicon Pixel Detector with Internal Gain Layer},
  author = {L. Paolozzi and M. Milanesio and T. Moretti and R. Cardella and T. Kugathasan and A. Picardi and M. Elviretti and H. Rücker and F. Cadoux and R. Cardarelli and L. Cecconi and S. Débieux and Y. Favre and C. A. Fenoglio and D. Ferrere and S. Gonzalez-Sevilla and L. Iodice and R. Kotitsa and C. Magliocca and M. Nessi and A. Pizarro-Medina and J. Saidi and M. Vicente Barreto Pinto and S. Zambito and G. Iacobucci},
  year = {2024},
  url = {https://arxiv.org/abs/2412.07606},
  note = {Source identifier: 2412.07606}
}