@misc{indiciae01aa90cc6256,
  title = {Defect density of states of tin oxide and copper oxide p-type thin-film transistors},
  author = {Måns J. Mattsson and Kham M. Niang and Jared Parker and David J. Meeth and John F. Wager and Andrew J. Flewitt and Matt W. Graham},
  year = {2024},
  doi = {10.1002/aelm.202400929},
  url = {https://arxiv.org/abs/2412.09533},
  note = {Source identifier: 2412.09533}
}