TY  - RPRT
TI  - Defect density of states of tin oxide and copper oxide p-type thin-film transistors
AU  - Måns J. Mattsson
AU  - Kham M. Niang
AU  - Jared Parker
AU  - David J. Meeth
AU  - John F. Wager
AU  - Andrew J. Flewitt
AU  - Matt W. Graham
PY  - 2024
DO  - 10.1002/aelm.202400929
UR  - https://arxiv.org/abs/2412.09533
ID  - 2412.09533
ER  -