TY  - RPRT
TI  - Investigating the Effect of Electrical and Thermal Transport Properties on Oxide-Based Memristors Performance and Reliability
AU  - Armin Gooran-Shoorakchaly
AU  - Sarah Sharif
AU  - Yaser Banad
PY  - 2024
UR  - https://arxiv.org/abs/2412.12450
ID  - 2412.12450
ER  -