TY  - RPRT
TI  - The random coupled-plaquette gauge model and the surface code under circuit-level noise
AU  - Manuel Rispler
AU  - Davide Vodola
AU  - Markus Müller
AU  - Seyong Kim
PY  - 2024
UR  - https://arxiv.org/abs/2412.14004
ID  - 2412.14004
ER  -