@misc{indiciaee7df80f54563,
  title = {Atomic resolution imaging of the strength and 3D direction of atomic displacements in functional oxide thin films},
  author = {Ian MacLaren and Aurys Silinga and Juri Barthel and Josee Kleibeuker and Judith L MacManus-Driscoll and Christopher S Allen and Angus I Kirkland},
  year = {2025},
  doi = {10.1103/p6qm-hpvk},
  url = {https://arxiv.org/abs/2412.16297},
  note = {Source identifier: 2412.16297}
}