TY  - RPRT
TI  - Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions
AU  - Evan B. Golden
AU  - Neel A. Parmar
AU  - Vasili K. Semenov
AU  - Sergey K. Tolpygo
PY  - 2025
UR  - https://arxiv.org/abs/2501.03343
ID  - 2501.03343
ER  -