@misc{indiciae8d7938cc32c2,
  title = {Detecting Defective Wafers Via Modular Networks},
  author = {Yifeng Zhang and Bryan Baker and Shi Chen and Chao Zhang and Yu Huang and Qi Zhao and Sthitie Bom},
  year = {2025},
  url = {https://arxiv.org/abs/2501.03368},
  note = {Source identifier: 2501.03368}
}