TY  - RPRT
TI  - Quality Control of Lifetime Drift in Discrete Electrical Parameters in Semiconductor Devices via Transition Modeling
AU  - Lukas Sommeregger
AU  - Jürgen Pilz
PY  - 2025
DO  - 10.1016/j.microrel.2024.115555.
UR  - https://arxiv.org/abs/2501.07115
ID  - 2501.07115
ER  -