@misc{indiciae473de725a9ab,
  title = {Impact of impurities on leakage current induced by High-Energy Density Pulsed Laser Annealing in Si diodes},
  author = {Richard Monflier and Richard Daubriac and Mahmoud Haned and Toshiyuki Tabata and François Olivier and Eric Imbernon and Markus Italia and Antonino La Magna and Fulvio Mazzamuto and Simona Boninelli and Fuccio Cristiano and Elena Bedel Pereira},
  year = {2025},
  url = {https://arxiv.org/abs/2501.07168},
  note = {Source identifier: 2501.07168}
}