@misc{indiciae2b0472a025cd,
  title = {One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories},
  author = {Christian Acal and Juan Eloy Ruiz-Castro and David Maldonado and Juan B. Roldán},
  year = {2025},
  doi = {10.3390/math9212734},
  url = {https://arxiv.org/abs/2501.07949},
  note = {Source identifier: 2501.07949}
}