TY  - RPRT
TI  - Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
AU  - Hoelen L. Lalandec Robert
AU  - Max Leo Leidl
AU  - Knut Müller-Caspary
AU  - Jo Verbeeck
PY  - 2025
UR  - https://arxiv.org/abs/2501.08874
ID  - 2501.08874
ER  -