@misc{indiciae51634f38ead3,
  title = {Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing},
  author = {Mohit Khurana and Sahar Delfan and Zhenhuan Yi},
  year = {2025},
  url = {https://arxiv.org/abs/2501.11590},
  note = {Source identifier: 2501.11590}
}