TY  - RPRT
TI  - Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing
AU  - Mohit Khurana
AU  - Sahar Delfan
AU  - Zhenhuan Yi
PY  - 2025
UR  - https://arxiv.org/abs/2501.11590
ID  - 2501.11590
ER  -