TY  - RPRT
TI  - A New Measure of Assembly Bias using the Environment Dependence of the Luminosity Function
AU  - Yikun Wang
AU  - Idit Zehavi
AU  - Sergio Contreras
AU  - Shaun Cole
AU  - Peder Norberg
PY  - 2025
UR  - https://arxiv.org/abs/2501.13204
ID  - 2501.13204
ER  -