@misc{indiciaea9c1ce73f08d,
  title = {Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses by FIB Passive Voltage Contrast},
  author = {Andrew D. Zonenberg and Antony Moor and Daniel Slone and Lain Agan and Mario Cop},
  year = {2025},
  url = {https://arxiv.org/abs/2501.13276},
  note = {Source identifier: 2501.13276}
}