TY  - RPRT
TI  - Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses by FIB Passive Voltage Contrast
AU  - Andrew D. Zonenberg
AU  - Antony Moor
AU  - Daniel Slone
AU  - Lain Agan
AU  - Mario Cop
PY  - 2025
UR  - https://arxiv.org/abs/2501.13276
ID  - 2501.13276
ER  -