@misc{indiciaebd5679d4de66,
  title = {Effective Defect Detection Using Instance Segmentation for NDI},
  author = {Ashiqur Rahman and Venkata Devesh Reddy Seethi and Austin Yunker and Zachary Kral and Rajkumar Kettimuthu and Hamed Alhoori},
  year = {2025},
  url = {https://arxiv.org/abs/2501.14149},
  note = {Source identifier: 2501.14149}
}