TY  - RPRT
TI  - In-Circuit Characterization of Low-Frequency Stability Margins in Power Amplifiers
AU  - Jose Manuel Gonzalez
AU  - Nerea Otegi
AU  - Aitziber Anakabe
AU  - Libe Mori
AU  - Asier Barcenilla
AU  - Juan-Mari Collantes
PY  - 2025
DO  - 10.1109/tmtt.2018.2883568
UR  - https://arxiv.org/abs/2501.16923
ID  - 2501.16923
ER  -