TY  - RPRT
TI  - Mechanism of Oxygen Reduction via Chemical Affinity in NiO/SiO2 Interfaces Irradiated with keV Energy Hydrogen and Helium Ions for Heterostructure Fabrication
AU  - Mario Mery
AU  - Claudio Gonzalez-Fuentes
AU  - Igor Stankovic
AU  - Jorge M. Nuñez
AU  - Jorge E. Valdés
AU  - Myriam H Aguirre
AU  - Carlos García
PY  - 2025
DO  - 10.1039/d4nh00460d
UR  - https://arxiv.org/abs/2501.17101
ID  - 2501.17101
ER  -