TY  - RPRT
TI  - Refining interface stress measurement in nanomultilayers through layer corrugation and interface roughness corrections
AU  - Yang Hu
AU  - Aleksandr Druzhinin
AU  - Claudia Cancellieri
AU  - Vladyslav Turlo
PY  - 2025
UR  - https://arxiv.org/abs/2501.18247
ID  - 2501.18247
ER  -