@misc{indiciae7aac1f67fe15,
  title = {Deep learning with reflection high-energy electron diffraction images to predict cation ratio in Sr\$\_\{2x\}\$Ti\$\_\{2(1-x)\}\$O\$\_\{3\}\$ thin films},
  author = {Sumner B. Harris and Patrick T. Gemperline and Christopher M. Rouleau and Rama K. Vasudevan and Ryan B. Comes},
  year = {2025},
  doi = {10.1021/acs.nanolett.5c00787},
  url = {https://arxiv.org/abs/2501.18523},
  note = {Source identifier: 2501.18523}
}