TY  - RPRT
TI  - The Influence of V-Defects, Leakage, and Random Alloy Fluctuations on the Carrier Transport in Red InGaN MQW LEDs
AU  - Huai-Chin Huang
AU  - Shih-Min Chen
AU  - Claude Weisbuch
AU  - James S. Speck
AU  - Yuh-Renn Wu
PY  - 2025
DO  - 10.1063/5.0261821
UR  - https://arxiv.org/abs/2501.19020
ID  - 2501.19020
ER  -