@misc{indiciae63cb782a9b19,
  title = {Exploring Few-Shot Defect Segmentation in General Industrial Scenarios with Metric Learning and Vision Foundation Models},
  author = {Tongkun Liu and Bing Li and Xiao Jin and Yupeng Shi and Qiuying Li and Xiang Wei},
  year = {2025},
  url = {https://arxiv.org/abs/2502.01216},
  note = {Source identifier: 2502.01216}
}