TY  - RPRT
TI  - Exploring Few-Shot Defect Segmentation in General Industrial Scenarios with Metric Learning and Vision Foundation Models
AU  - Tongkun Liu
AU  - Bing Li
AU  - Xiao Jin
AU  - Yupeng Shi
AU  - Qiuying Li
AU  - Xiang Wei
PY  - 2025
UR  - https://arxiv.org/abs/2502.01216
ID  - 2502.01216
ER  -