@misc{indiciaefedd671eca93,
  title = {The Role of Tunneling Oxide in the Low Frequency Noise of Multi-level Silicon Nitride ReRAMs},
  author = {Nikolaos Vasileiadis and Alexandros Mavropoulis and Christoforos Theodorou and Panagiotis Dimitrakis},
  year = {2025},
  doi = {10.1109/icnf57520.2023.10472745},
  url = {https://arxiv.org/abs/2502.03912},
  note = {Source identifier: 2502.03912}
}