TY  - RPRT
TI  - The Role of Tunneling Oxide in the Low Frequency Noise of Multi-level Silicon Nitride ReRAMs
AU  - Nikolaos Vasileiadis
AU  - Alexandros Mavropoulis
AU  - Christoforos Theodorou
AU  - Panagiotis Dimitrakis
PY  - 2025
DO  - 10.1109/icnf57520.2023.10472745
UR  - https://arxiv.org/abs/2502.03912
ID  - 2502.03912
ER  -