TY  - RPRT
TI  - Upgrading Quantum Metrology by Combined Sensitivity Resources in Mixed Linear-Nonlinear Light-Matter Interactions with Bias Field
AU  - Zu-Jian Ying
PY  - 2025
DO  - 10.1103/rtd9-z7cl
UR  - https://arxiv.org/abs/2502.04466
ID  - 2502.04466
ER  -