TY  - RPRT
TI  - Full-cycle device-scale simulations of memory materials with a tailored atomic-cluster-expansion potential
AU  - Yuxing Zhou
AU  - Daniel F. Thomas du Toit
AU  - Stephen R. Elliott
AU  - Wei Zhang
AU  - Volker L. Deringer
PY  - 2025
UR  - https://arxiv.org/abs/2502.08393
ID  - 2502.08393
ER  -