TY  - RPRT
TI  - Characterization of ion track etched conical nanopores in thermal and PECVD SiO$_{2}$ using small angle X-ray scattering
AU  - Shankar Dutt
AU  - Rudradeep Chakraborty
AU  - Christian Notthoff
AU  - Pablo Mota-Santiago
AU  - Christina Trautmann
AU  - Patrick Kluth
PY  - 2025
UR  - https://arxiv.org/abs/2502.14118
ID  - 2502.14118
ER  -