TY  - RPRT
TI  - Less is More: On the Importance of Data Quality for Unit Test Generation
AU  - Junwei Zhang
AU  - Xing Hu
AU  - Shan Gao
AU  - Xin Xia
AU  - David Lo
AU  - Shanping Li
PY  - 2025
UR  - https://arxiv.org/abs/2502.14212
ID  - 2502.14212
ER  -