TY  - RPRT
TI  - SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image
AU  - Qian Jin
AU  - Yuqi Jiang
AU  - Xudong Lu
AU  - Yumeng Liu
AU  - Yining Chen
AU  - Dawei Gao
AU  - Qi Sun
AU  - Cheng Zhuo
PY  - 2025
DO  - 10.1145/3676536.3676752
UR  - https://arxiv.org/abs/2502.14884
ID  - 2502.14884
ER  -