TY  - RPRT
TI  - $\mathcal{N}=4$ line defect correlators of type BCD
AU  - Yasuyuki Hatsuda
AU  - Hai Lin
AU  - Tadashi Okazaki
PY  - 2025
DO  - 10.1007/jhep07(2025)054
UR  - https://arxiv.org/abs/2502.18110
ID  - 2502.18110
ER  -