@misc{indiciaed792f22d4e26,
  title = {Scalable and Accurate Application-Level Crash-Consistency Testing via Representative Testing},
  author = {Yile Gu and Ian Neal and Jiexiao Xu and Shaun Christopher Lee and Ayman Said and Musa Haydar and Jacob Van Geffen and Rohan Kadekodi and Andrew Quinn and Baris Kasikci},
  year = {2025},
  doi = {10.1145/3720431},
  url = {https://arxiv.org/abs/2503.01390},
  note = {Source identifier: 2503.01390}
}