TY  - RPRT
TI  - OCL: Ordinal Contrastive Learning for Imputating Features with Progressive Labels
AU  - Seunghun Baek
AU  - Jaeyoon Sim
AU  - Guorong Wu
AU  - Won Hwa Kim
PY  - 2025
DO  - 10.1007/978-3-031-72069-7_32
UR  - https://arxiv.org/abs/2503.02899
ID  - 2503.02899
ER  -