@misc{indiciae3fa351e1576d,
  title = {Quality Concerns Caused by Quality Control -- deformation of silicon strip detector modules in thermal cycling tests},
  author = {Richard Salami and Luise Poley and Kirsten Affolder and Tony Affolder and Lukas Bayer and Ben Crick and Emily Duden and Ian George Dyckes and Vitaliy Fadeyev and Anne Fortman and Pavol Federic and Laura Franconi and Matthew Gignac and Shubham Gupta and John Hallford and Cole Helling and Ewan Hill and Miao Hu and Jiri Kroll and Priyanka Kumari and Carlos Lacasta and Madison Levagood and Hanlez Lopez and Len Morelos-Zaragoza and Meny Raviv Moshe and Aaron Petersen and Vicente Platero and Archa Devi Rajagopalan and Lisa Sitnikova and Carles Solaz and Urmila Soldevila and Peter Speers and Gerrit Van Nieuwenhuizen and Alex Zeng Wang},
  year = {2025},
  doi = {10.1088/1748-0221/20/03/p03004},
  url = {https://arxiv.org/abs/2503.03133},
  note = {Source identifier: 2503.03133}
}