TY  - RPRT
TI  - The Role of Hydrogen and Oxygen Interstitial Defects in Crystalline Si cells: Mechanism of Device Degradation in Humid Environment
AU  - Bo Li
AU  - Feifei Zhang
AU  - Yu Pang
AU  - Jinyu Hu
AU  - Huiyan Zhao
AU  - Guocai Liu
AU  - Chao He
AU  - Xingtao An
PY  - 2026
DO  - 10.1021/acs.jpcc.5c07821
UR  - https://arxiv.org/abs/2503.11100
ID  - 2503.11100
ER  -