@misc{indiciaed2dbd9b495d8,
  title = {SCAN-BEST: Sub-6GHz-Aided Near-field Beam Selection with Formal Reliability Guarantees},
  author = {Weicao Deng and Binpu Shi and Min Li and Osvaldo Simeone},
  year = {2026},
  doi = {10.1109/tccn.2026.3657091},
  url = {https://arxiv.org/abs/2503.13801},
  note = {Source identifier: 2503.13801}
}