TY  - RPRT
TI  - Hot-carrier thermal breakdown and S-type current-voltage characteristics in perforated graphene structures
AU  - V. Ryzhii
AU  - C. Tang
AU  - M. Ryzhii
AU  - M. S. Shur
PY  - 2025
UR  - https://arxiv.org/abs/2503.13943
ID  - 2503.13943
ER  -