@misc{indiciaeed18c7e17ced,
  title = {BPINN-EM-Post: Bayesian Physics-Informed Neural Network based Stochastic Electromigration Damage Analysis in the Post-void Phase},
  author = {Subed Lamichhane and Haotian Lu and Sheldon X. -D. Tan},
  year = {2026},
  url = {https://arxiv.org/abs/2503.17393},
  note = {Source identifier: 2503.17393}
}