TY  - RPRT
TI  - BPINN-EM-Post: Bayesian Physics-Informed Neural Network based Stochastic Electromigration Damage Analysis in the Post-void Phase
AU  - Subed Lamichhane
AU  - Haotian Lu
AU  - Sheldon X. -D. Tan
PY  - 2026
UR  - https://arxiv.org/abs/2503.17393
ID  - 2503.17393
ER  -