@misc{indiciaec907e5a167bf,
  title = {A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing incidence X-ray diffraction},
  author = {Fabian Gasser and Sanjay John and Jorid Smets and Josef Simbrunner and Mario Fratschko and Víctor Rubio-Giménez and Rob Ameloot and Hans-Georg Steinrück and Roland Resel},
  year = {2025},
  doi = {10.1107/s1600576725004935},
  url = {https://arxiv.org/abs/2503.20625},
  note = {Source identifier: 2503.20625}
}