TY  - RPRT
TI  - A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing incidence X-ray diffraction
AU  - Fabian Gasser
AU  - Sanjay John
AU  - Jorid Smets
AU  - Josef Simbrunner
AU  - Mario Fratschko
AU  - Víctor Rubio-Giménez
AU  - Rob Ameloot
AU  - Hans-Georg Steinrück
AU  - Roland Resel
PY  - 2025
DO  - 10.1107/s1600576725004935
UR  - https://arxiv.org/abs/2503.20625
ID  - 2503.20625
ER  -